By Anthony J. Klimasara (auth.), John V. Gilfrich, Camden R. Hubbard, Ron Jenkins, Deane K. Smith, Ting C. Huang, Michael R. James, Gerald R. Lachance, Paul K. Predecki (eds.)
Mathematical recommendations in XRay Spectrometry: learn within the Quantitative research of person debris by way of XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of sunshine components by means of XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS options and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, commercial, and different functions of XRS: software of XRF within the Aluminum (F.R. Feret). XRay Characterization of skinny Films: Grazing occurrence XRay Characterization of fabrics (D.K. Bowen, M. Wormington). WholePattern becoming, section research by means of Diffraction Methods: part identity utilizing WholePattern Matching (D.K. Smith et al.). Polymer functions of XRD. HighTemperature and NonAmbient functions of XRD. tension and pressure decision by way of Diffraction equipment, top Broadening research. XRD strategies and Instrumentation. seventy one extra articles. Index.
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Extra resources for Advances in X-Ray Analysis: Volume 36
Characteristic X-ray peaks may be identified manually or automatically with color coded K,L, or M lines. Calibration curves are developed with an interactive routine that creates standard files by least-squares fitting peak intensities to known elemental abundances. Elemental abundances in unknowns may be determined at acquisition time, or by batch analysis of spectra stored on disc. The setup menu enables SUPERXAP to accept, analyze, output, and store data. Calibration curves may be established for standards.
Part of this material was polished flat to serve as a reference sample while the remaining material was ground into particles. These particles were then blown through a high-temperature zone in a tube furnace at 1300 ·C to form spherical shaped particles having different Advances in X-Ray Analysis, Vol. V. , Plenum Press, New York, 1993 11 I. 2 The spherical particles were then sieved to obtain size fractions from 50 to 170 ~m for investigation. 47% CaO. A NIST x-ray microfluorescence spectrometer used in this work was described previously3.
C:: IS' N 10 '0 >- '. ;! :s Q1 ~ . ' . 'E e v; _ 10 .. :s ~ ~05 0:: E ::> ~ 0 ::E: 50 100 150 Apparent Particle Diameter [jJmJ Figure 2. Maximum relative intensities of calcium (a), zinc (b), and strontium (c) Ka lines measured relative to a particle (110 ~m in diameter) vs. spherical particle diameter. Solid line is a Monte Carlo simulation. M. LANKOSZ 15 ET AL. l!! pml Figure 3. Maximum relative intensity of calcium Ka line vs. average chip size. Solid line is a Monte Carlo simulation for spherical particles.
Advances in X-Ray Analysis: Volume 36 by Anthony J. Klimasara (auth.), John V. Gilfrich, Camden R. Hubbard, Ron Jenkins, Deane K. Smith, Ting C. Huang, Michael R. James, Gerald R. Lachance, Paul K. Predecki (eds.)